Scanning transmission helium ion microscopy on carbon nanomembranes

• Daniel Emmrich,
• Annalena Wolff,
• Nikolaus Meyerbröker,
• Jörg K. N. Lindner,
• André Beyer and
• Armin Gölzhäuser

Beilstein J. Nanotechnol. 2021, 12, 222–231, doi:10.3762/bjnano.12.18

• Technology, 2 George St, Brisbane 4000, QLD, Australia CNM Technologies, Bielefeld, Germany Department of Physics, Paderborn University, Paderborn, Germany 10.3762/bjnano.12.18 Abstract A dark-field scanning transmission ion microscopy detector was designed for the helium ion microscope. The detection

• energy-filtered transmission electron microscopy measurements. Keywords: carbon nanomembranes; dark field; helium ion microscopy (HIM); scanning transmission ion microscopy (STIM); SRIM simulations; Introduction Throughout the past decade, the helium ion microscope (HIM) has emerged as a versatile

• -field scanning transmission ion microscopy (STIM) holder. The holder design is based on the concept of a SE conversion holder. The holder can easily be implemented into any existing HIM. It is mounted on the sample stage without modifications to the microscope. Carbon nanomembranes (CNMs) serve as test

Bio-imaging with the helium-ion microscope: A review

• Matthias Schmidt,
• James M. Byrne and
• Ilari J. Maasilta

Beilstein J. Nanotechnol. 2021, 12, 1–23, doi:10.3762/bjnano.12.1

• ions. Whilst accelerator-based transmission ion-microscopy using protons or alpha particles has been used to investigate biological specimens since the 1980s [53], none of the few (scanning) transmission helium-ion microscopy (THIM) studies using 10 to 40 kV helium ions have imaged biological specimens

Scanning transmission imaging in the helium ion microscope using a microchannel plate with a delay line detector

• Eduardo Serralta,
• Nico Klingner,
• Olivier De Castro,
• Michael Mousley,
• Santhana Eswara,
• Serge Duarte Pinto,
• Tom Wirtz and
• Gregor Hlawacek

Beilstein J. Nanotechnol. 2020, 11, 1854–1864, doi:10.3762/bjnano.11.167

• based on a microchannel plate with a delay line readout structure has been developed to perform scanning transmission ion microscopy (STIM) in the helium ion microscope (HIM). This system is an improvement over other existing approaches since it combines the information of the scanning beam position on

• microscopy; scanning transmission ion microscopy; Introduction The helium ion microscope (HIM) is an instrument that has already proven its value for high-resolution imaging, compositional analysis, nanofabrication, and materials modification [1][2]. It generates a focused helium (or neon) ion beam with sub

• work, we present a new system for comprehensive scanning transmission ion microscopy (STIM) analyses that gives more flexibility to the user than the earlier approaches. We adopted a microchannel plate (MCP) and a delay line readout structure as a position-sensitive detector to be used in the HIM. A

Stationary beam full-field transmission helium ion microscopy using sub-50 keV He⁺: Projected images and intensity patterns

• Michael Mousley,
• Santhana Eswara,
• Olivier De Castro,
• Olivier Bouton,
• Nico Klingner,
• Christoph T. Koch,
• Gregor Hlawacek and
• Tom Wirtz

Beilstein J. Nanotechnol. 2019, 10, 1648–1657, doi:10.3762/bjnano.10.160

• diffraction; ion scattering; transmission ion microscopy; Introduction The use of helium ions for microscopy and nanoanalysis is gaining popularity due to the availability of the high-brightness gas field ion source (GFIS) [1]. Due to the high brightness, the probe from a GFIS can be focused into a spot of

• prior work on transmission ion microscopy was performed by Melmed and Smit [26]. Unlike the instrument presented here, their setup was based on a lens-less point projection configuration. This paper presents THIM shadow images as well as the deflected He+ ion intensity patterns recorded with sub-50 keV